Establishing Traceability of an Electronic Calibration Unit Using the NIST Microwave Uncertainty Framework

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【标题】Establishing Traceability of an Electronic Calibration Unit Using the NIST Microwave Uncertainty Framework

【作者】 Jeffrey A. Jargon  Dylan F. Williams  Thomas M. Wallis  Denis X. LeGolvan  Paul D. Hale 

【关键词】Traceability Calibration Confidence Bounds Network Analyzer VNA 

【摘要】We present a method for establishing traceability of a commercial electronic calibration unit for vector network analyzers by characterizing the scattering parameters of its internal states with repeated multiline thru-reflect-line (TRL) calibrations and utilizing the NIST Microwave Uncertainty Framework to propagate uncertainties. With the electronic calibration unit characterized; we use it to calibrate a network analyzer; and characterize a number of verification devices with corresponding uncertainties. We also characterize the same verification devices using one of the previous multiline TRL calibrations; and compare results. Index Terms — Electronic calibration unit; traceability; uncertainty; vector network analyzer.

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